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IRDT-P
IRDT-P Production-Level Detector Test System
IRDT-P · IRDT Series

Production-Level Detector Test System

Product Level Detector Test System
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Specifications

Test Level
Production level
Electrical Config
Bias Supply
Channels6~64
Voltage±15V/±25V/±5V
Max Current100mA/500mA/1000mA
Noise0.1mV @1MHz
Clock Drivers
Channels6~32
Voltage-25V~+25V
Period32ns adjustable
Max Frequency200KHz
Analog Acquisition
Channels4~64
Range±10V/±5V/±1V/±0.5V
Sampling Rate200KHz/500KHz/1MHz
Digital Acquisition
Camera LinkLVDS 32ch diff 1.25Mb/sLVDS 32ch parallel 200MHzTTL/LVDS 32ch single-ended/bus 120-200MHz
Optical Config
Area-source Blackbody
Emitting Area100×100 / 200×200 / 300×300mm
Temperature0~100℃
Resolution0.001℃
Integrating Sphere
Spectral Range8~13μm
Aperture>50mm
Uniformity≥99%
Lamp Source1 or 2 lamps (MWIR/LWIR)
Features
System noise <120μVSupports large-format integrated detectorsGPU-accelerated image processingModular & scalable

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Product Information

Specifications and product descriptions are organized from company product materials. Complete model configuration and selection details are available from the application engineering team.

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Contact Us
Phone028-8437 8986Phone139-1024-4012Emailsales@iescd.com
Hours · Mon–Fri 09:00–18:00
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